发明公开
- 专利标题: STRAHLUNGSMESSVORRICHTUNG
- 专利标题(英): Radiation measuring device
- 专利标题(中): 辐射测量设备
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申请号: EP02776996.7申请日: 2002-09-05
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公开(公告)号: EP1423667A2公开(公告)日: 2004-06-02
- 发明人: SCHULZ, Ulrich , DREIER, Erich
- 申请人: Edus Systemtechnik GmbH
- 申请人地址: Breitlestr. 36 88662 Überlingen DE
- 专利权人: Edus Systemtechnik GmbH
- 当前专利权人: Edus Systemtechnik GmbH
- 当前专利权人地址: Breitlestr. 36 88662 Überlingen DE
- 代理机构: Daub, Nicole
- 优先权: DE10144160 20010908
- 国际公布: WO2003023337 20030320
- 主分类号: G01J1/00
- IPC分类号: G01J1/00
摘要:
The invention relates to a radiation measuring device, especially for measuring high power radiation (10), comprising a measuring window (12) and a deflecting unit which can guide at least one part of the radiation which is to be measured (10) from the measuring window (12) to a sensor unit (14). According to the invention, the deflecting unit comprises at least one bar (16) into which the radiation (10) is injected via the measuring window (12), parallel to the longitudinal extension (18) thereof, via a side (70). The radiation is retransmitted along the longitudinal extension of the surface (18) bar to the sensor unit (14).
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