发明公开
EP1443546A2 Working method of metal material and semiconductor apparatus fabricated by the method 审中-公开
Verfahren zur Metallbearbeitung und mit diesem Verfahren hergestelltes Halbleiterbauelement

  • 专利标题: Working method of metal material and semiconductor apparatus fabricated by the method
  • 专利标题(中): Verfahren zur Metallbearbeitung und mit diesem Verfahren hergestelltes Halbleiterbauelement
  • 申请号: EP04000247.9
    申请日: 2004-01-08
  • 公开(公告)号: EP1443546A2
    公开(公告)日: 2004-08-04
  • 发明人: Kobayashi, MasuyukiHarada, KoujiTokuda, HiroatsuOjima, Kazuo
  • 申请人: Hitachi Ltd.
  • 申请人地址: 6, Kanda Surugadai 4-chome, Chiyoda-ku Tokyo JP
  • 专利权人: Hitachi Ltd.
  • 当前专利权人: Hitachi Ltd.
  • 当前专利权人地址: 6, Kanda Surugadai 4-chome, Chiyoda-ku Tokyo JP
  • 代理机构: Beetz & Partner Patentanwälte
  • 优先权: JP2003018185 20030128
  • 主分类号: H01L21/48
  • IPC分类号: H01L21/48
Working method of metal material and semiconductor apparatus fabricated by the method
摘要:
A method comprising constraining a circumference of a blank of a Cu-Mo alloy and one of surfaces to be worked with the use of a die, and using a working punch (33) or a counter punch (34) to apply working pressures to the other of the surfaces to be worked, thereby obtaining a cup-shaped body (27), and a semiconductor apparatus comprising a semiconductor chip fixed to an inner bottom surface of a cup-shaped diode base (27).
信息查询
0/0