The invention relates to a device (10) for identifying concentrations of elements in samples. Said device comprises a continuous radiation source (14), a high-resolution spectrometer (28), an imaging optical system (16, 22, 26) which images the radiation of the radiation source (14) onto the entrance gap (52) of the spectrometer (28), and a detector (32) in the exit gap plane of the spectrometer (28). Said detector is provided with a plurality of detector elements which are used to scan a spectral range in which at least one spectral line of at least one element to be identified lies, said scanned range also including a surrounding area of said spectral line. The device (10) is further characterized in that the imaging optical system (16, 22, 26) generates at least three real images of the radiation source (14), that a sample compartment (34) is provided at the site of a first real image (18) and a sample compartment (36) at the site of an additional real image (24). The atomization device may be a graphite tube (36) or a flame (34) and emission can be induced by ICP torch. The spectrometer (28) is an echelle spectrometer.