Invention Publication
EP1475603A2 Calibration method for a surface texture measuring instrument and said instrument
审中-公开
用于设备校准的方法,用于测量表面纹理,并且所述设备
- Patent Title: Calibration method for a surface texture measuring instrument and said instrument
- Patent Title (中): 用于设备校准的方法,用于测量表面纹理,并且所述设备
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Application No.: EP04010601.5Application Date: 2004-05-04
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Publication No.: EP1475603A2Publication Date: 2004-11-10
- Inventor: Takemura, Isamu
- Applicant: Mitutoyo Corporation
- Applicant Address: 20-1, Sakado 1-chome, Takatsu-ku Kawasaki-shi, Kanagawa 213-8533 JP
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: 20-1, Sakado 1-chome, Takatsu-ku Kawasaki-shi, Kanagawa 213-8533 JP
- Agency: Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
- Priority: JP2003129882 20030508
- Main IPC: G01B5/28
- IPC: G01B5/28 ; G01B21/30 ; G01B5/20 ; G01B21/20 ; G01B5/008 ; G01B21/04 ; G05B19/401
Abstract:
In a calibration method for a surface texture measuring instrument which measures the surface of a workpiece and includes an arm that is supported to be swingable around a base point thereof and is provided with a contact point at an end for scanning the workpiece surface, the calibration method includes a measurement step for measuring a calibration gauge the cross section of which contains a part of a substantially perfect circle, an assignment step for assigning the detection results from the measurement step in an evaluation formula based on the equation of a circle in which the center coordinates of the calibration gauge are (x c , z c ) and the radius is "r", and a calibration step for calibrating each parameter based on the results obtained in the assignment step.
Public/Granted literature
- EP1475603B1 Calibration method for a surface texture measuring instrument and said instrument Public/Granted day:2018-09-19
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