发明公开
- 专利标题: MEASUREMENT METHOD FOR DETERMINING A SURFACE PROFILE
- 专利标题(中): 测量方法确定表面PROFILE
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申请号: EP03709731.8申请日: 2003-02-26
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公开(公告)号: EP1478899A2公开(公告)日: 2004-11-24
- 发明人: CROUZEN, Paulus, Carolus, Nicolaas
- 申请人: SHELL INTERNATIONALE RESEARCHMAATSCHAPPIJ B.V.
- 申请人地址: Carel van Bylandtlaan 30 2596 HR Den Haag NL
- 专利权人: SHELL INTERNATIONALE RESEARCHMAATSCHAPPIJ B.V.
- 当前专利权人: SHELL INTERNATIONALE RESEARCHMAATSCHAPPIJ B.V.
- 当前专利权人地址: Carel van Bylandtlaan 30 2596 HR Den Haag NL
- 优先权: EP02075765 20020226
- 国际公布: WO2003073040 20030904
- 主分类号: G01B7/28
- IPC分类号: G01B7/28 ; G01N27/90
摘要:
A method of determining a surface profile of an electrically conductive object, using probe comprising a transmitter/receiver arrangement for inducing transient eddy currents in the object, for providing a signal indicative of a magnetic field property, the method comprising: a) selecting a calibration point on the surface, and a number of calibration positions of the transmitter/receiver arrangement; b) determining a set of calibration values by determining, for each of the calibration positions, a characteristic value of the signal generated in the receiver in response to transient eddy currents induced in the object by the transmitter, wherein the characteristic value relates to the amplitude of the signal; c) determining a calibration function which relates the calibration values to the relative location of calibration position and calibration point; d) selecting a set of inspection points on the surface of the object, and a set of corresponding inspection positions of the transmitter/receiver arrangement; e) determining a set of inspection values by determining, for each of the inspection positions, a characteristic value of the signal generated in the receiver in response to transient eddy currents induced in the object by the transmitter; and f) determining the surface profile by interpreting the set of inspection values, using the calibration function, wherein the relative location of inspection points and corresponding inspection positions is derived.
公开/授权文献
- EP1478899B1 MEASUREMENT METHOD FOR DETERMINING A SURFACE PROFILE 公开/授权日:2005-12-07
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