发明公开
- 专利标题: SIR MEASUREMENT DEVICE AND METHOD
- 专利标题(中): SIR-MESSUNGSEINRICHTUNG UND VERFAHREN
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申请号: EP03719148.3申请日: 2003-04-21
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公开(公告)号: EP1499032A1公开(公告)日: 2005-01-19
- 发明人: SETO, Yoshitaka , NISHIO, Akihiko
- 申请人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- 申请人地址: 1006, Oaza-Kadoma Kadoma-shi, Osaka 571-8501 JP
- 专利权人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- 当前专利权人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- 当前专利权人地址: 1006, Oaza-Kadoma Kadoma-shi, Osaka 571-8501 JP
- 代理机构: Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
- 优先权: JP2002117081 20020419
- 国际公布: WO2003090372 20031030
- 主分类号: H04B1/707
- IPC分类号: H04B1/707
摘要:
An SIR measuring apparatus capable of measuring an SIR after interference cancellation with a high degree of accuracy in a short time after its reception without performing JD demodulation. This apparatus creates a delay profile using midamble sections and measures the SIR using this delay profile and estimated path positions. That is, the signal power measuring section (142) measures signal power from the delay profile and the positions of the selected paths and the interference power measuring section (144) measures interference power from the delay profile and the positions of the selected paths. Then, the signal power correction section (146) and interference power correction section (148) perform necessary corrections and the SIR calculation section (150) calculates the SIR according to predetermined calculation formulas.
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