发明授权
- 专利标题: MAGNETIC TUNNEL JUNCTION MEMORY CELL ARCHITECTURE
- 专利标题(中): 磁隧道势垒存储器单元架构
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申请号: EP03773669.1申请日: 2003-10-28
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公开(公告)号: EP1556863B1公开(公告)日: 2006-03-22
- 发明人: DEBROSSE, John , GOGL, Dietmar , HOENIGSCHMID, Heinz
- 申请人: Infineon Technologies AG , International Business Machines Corporation
- 申请人地址: St.-Martin-Strasse 53 81669 München DE
- 专利权人: Infineon Technologies AG,International Business Machines Corporation
- 当前专利权人: Infineon Technologies AG,International Business Machines Corporation
- 当前专利权人地址: St.-Martin-Strasse 53 81669 München DE
- 代理机构: Charles, Glyndwr
- 优先权: US422225P 20021030; US422100 20030424
- 国际公布: WO2004040580 20040513
- 主分类号: G11C11/16
- IPC分类号: G11C11/16
摘要:
A memory device includes a magnetic tunnel junction memory cell having a magnetic tunnel junction structure (114) and a read switch. In one example, the read switch is connected to a conductor that is used to write to the magnetic tunnel junction structure (104). In a further example, the read switch is a transistor electrically coupled to the magnetic tunnel junction structure by a deep via contact. In a further example, the memory device includes a plurality of magnetic tunnel junction memory cells and a plurality of conductors respectively associated with the cells for writing information to the associated magnetic tunnel junction structures. Each read switch (106) is connected to the conductor (110) associated with a magnetic tunnel junction cell other than the cell in which the read switch resides.
公开/授权文献
- EP1556863A1 MAGNETIC TUNNEL JUNCTION MEMORY CELL ARCHITECTURE 公开/授权日:2005-07-27
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