发明公开
- 专利标题： TRANSPARENT MEASURING DEVICE WITH ENHANCED VISIBILITY LINES
- 专利标题（中）： 具有更高的可视性LINES透明测量装置
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申请号： EP03764806申请日： 2003-07-17
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公开(公告)号： EP1575786A4公开(公告)日： 2007-10-31
- 发明人: SCHAFER RANDAL D
- 申请人： SCHAFER MARGARET D
- 专利权人： SCHAFER MARGARET D
- 当前专利权人： SCHAFER MARGARET D
- 优先权： US39687602 2002-07-17
- 主分类号： G01B3/02
- IPC分类号： G01B3/02 ; B26B29/06 ; B43L7/00 ; B43L7/027 ; G01B20060101 ; G01D21/00 ; G03B27/42
摘要：
A transparent measuring device with enhanced visibility lines formed on a transparent substrate having opposing planar front and back surfaces and with at least one opaque line formed on one of the front and back surfaces and at least one transparent line formed on one of the front and back surfaces to be colinear with the at least one opaque line to present a composite line where the transparent line permits viewing of material on which the device is placed while highlighting the at least one opaque line for enhanced visibility. The transparent line may be formed of excitable pigment that reacts to light, such as a black light, or that retains luminance after exposure to light.
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