发明公开
- 专利标题: Full Width Array Scanning Spectrophotometer
- 专利标题(中): 光学扫描仪用的整个宽度的检测器阵列
-
申请号: EP05103385.0申请日: 2005-04-26
-
公开(公告)号: EP1591761A3公开(公告)日: 2009-09-30
- 发明人: Mestha, Lalit K. , Tandon, Jagdish C. , Bolte, Steven B.
- 申请人: Xerox Corporation
- 申请人地址: Xerox Square - 20A, 100 Clinton Avenue South Rochester, New York 14644 US
- 专利权人: Xerox Corporation
- 当前专利权人: Xerox Corporation
- 当前专利权人地址: Xerox Square - 20A, 100 Clinton Avenue South Rochester, New York 14644 US
- 代理机构: Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
- 优先权: US833231 20040427
- 主分类号: G01J3/50
- IPC分类号: G01J3/50
摘要:
A full width array spectrophotometer for full width scanning color analysis of color test targets, with one or two substantially linear elongated arrays of closely spaced multiple LED illumination sources of plural different color emissions in a multiply repeated pattern of at least three or four different colors transversely spanning a printer paper path and sequentially illuminated to illuminate a transverse band across a printed sheet moving in the paper path, and a corresponding elongated low cost light imaging bar comprising a parallel and correspondingly elongated array of multiple closely spaced different color sensitive (three or four rows of color-filtered) photodetectors, which imaging bar is positioned to detect and analyze light reflected from the transverse sequentially illuminated band.
公开/授权文献
- EP1591761A2 Full Width Array Scanning Spectrophotometer 公开/授权日:2005-11-02
信息查询