发明公开
EP1637868A1 IMPURITY MEASURING METHOD AND DEVICE
审中-公开
VERFAHREN UND VORRICHTUNG ZUR MESSUNG VON VERUNREINIGUNGEN
- 专利标题: IMPURITY MEASURING METHOD AND DEVICE
- 专利标题(中): VERFAHREN UND VORRICHTUNG ZUR MESSUNG VON VERUNREINIGUNGEN
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申请号: EP04745872.4申请日: 2004-06-14
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公开(公告)号: EP1637868A1公开(公告)日: 2006-03-22
- 发明人: KURAMASU, Yukio, Light Metal Company, Ltd. , NUKAMI, Tetsuya
- 申请人: Nippon Light Metal Company Ltd. , Toyota Jidosha Kabushiki Kaisha
- 申请人地址: 2-20 Higashi-shinagawa, 2-chome Shinagawa-ku, Tokyo 140-8628 JP
- 专利权人: Nippon Light Metal Company Ltd.,Toyota Jidosha Kabushiki Kaisha
- 当前专利权人: Nippon Light Metal Company Ltd.,Toyota Jidosha Kabushiki Kaisha
- 当前专利权人地址: 2-20 Higashi-shinagawa, 2-chome Shinagawa-ku, Tokyo 140-8628 JP
- 代理机构: Maser, Jochen
- 优先权: JP2003167310 20030612
- 国际公布: WO2004111619 20041223
- 主分类号: G01N21/17
- IPC分类号: G01N21/17 ; G01N33/20
摘要:
An impurity measuring device includes a table (T) on which a sample (S) is to be placed with its fracture surface (h) facing up, an illuminating means (7) for irradiating the fracture surface (h) with light (L) from a plurality of directions, an image sensing means for sensing an image of the fracture surface (h) irradiated with the light (L), continuous tone color image processing means for processing the sensed image into a continuous tone color image, and a binarizing means for binarizing the continuous tone color image through comparison between the result of the continuous tone color image processing and a threshold value. As the fracture surface (h) is irradiated with the light (L) from the plurality of directions, the image obtained by sensing the image of the fracture surface (h) is free from shading or optical irregularities caused by minute irregularities on the fracture surface (h). Therefore, impurities in the sample (S) can be accurately detected from the fracture surface (h) by subjecting the image to the continuous tone color image processing and binarization.
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