发明公开
EP1742260A2 Controlling lateral distribution of air gaps in interconnects
审中-公开
在Interkonnekts的Vont Luftspalten
- 专利标题: Controlling lateral distribution of air gaps in interconnects
- 专利标题(中): 在Interkonnekts的Vont Luftspalten
-
申请号: EP06291020.3申请日: 2006-06-21
-
公开(公告)号: EP1742260A2公开(公告)日: 2007-01-10
- 发明人: Torres, Joaquin , Gosset, Laurent-Georges
- 申请人: STMicroelectronics ( Crolles 2) SAS , Koninklijke Philips Electronics N.V.
- 申请人地址: 850, rue Jean Monnet 38920 Crolles FR
- 专利权人: STMicroelectronics ( Crolles 2) SAS,Koninklijke Philips Electronics N.V.
- 当前专利权人: STMicroelectronics ( Crolles 2) SAS,Koninklijke Philips Electronics N.V.
- 当前专利权人地址: 850, rue Jean Monnet 38920 Crolles FR
- 代理机构: Verdure, Stéphane
- 优先权: EP05291485 20050708
- 主分类号: H01L21/768
- IPC分类号: H01L21/768
摘要:
The invention relates to using properties of a hard mask liner against the diffusion of a removal agent to prevent air cavities formation in specific areas of an interconnect stack. The inventive method includes defining a portion on a surface of an IC interconnect stack as being specific to air cavity introduction where the defined portion is smaller than the surface of the substrate; producing at least one metal track within the interconnect stack and depositing at least one interconnect layer having a sacrificial material and a permeable material within the interconnect stack; defining at least one trench area surrounding the defined portion and forming at least one trench; depositing a hard mask layer to coat the trench; and forming at least one air cavity below the defined portion of the surface by using a removal agent for removing the sacrificial material to which the permanent material is resistant to.
公开/授权文献
信息查询
IPC分类: