发明公开
- 专利标题: SYSTEM AND METHOD FOR ASSESSING VIRTUAL SLIDE IMAGE QUALITY
- 专利标题(中): 系统和方法评价图像质量虚拟载片
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申请号: EP05760517申请日: 2005-05-26
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公开(公告)号: EP1751599A4公开(公告)日: 2010-07-21
- 发明人: OLSON ALLEN , SALIGRAMAL KIRAN , SOENKSEN DIRK G
- 申请人: APERIO TECHNOLOGIES INC
- 专利权人: APERIO TECHNOLOGIES INC
- 当前专利权人: APERIO TECHNOLOGIES INC
- 优先权: US57504704 2004-05-27
- 主分类号: G06T7/00
- IPC分类号: G06T7/00 ; A61B8/02 ; G01N27/72 ; G02B7/04 ; G02B21/36 ; G06K9/00
摘要:
Systems and methods for assessing virtual microscope slide image quality are provided. In order to determine whether a virtual slide image has any out of focus areas and is therefore a candidate for manual inspection, the various focus points used to scan the virtual slide image are used to calculate a best fit surface for the virtual slide image. The distance of each focus point from the best fit surface is then calculated and the largest distance is compared to a predetermined value. If the largest distance from a focus point to the best fit surface is larger than the predetermined value, then the virtual slide image is designated as needing a manual inspection and possible re-scan.
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