发明授权
EP1760903B1 WIDE BAND TEST GRAB WIRE UNIT, WIDE BAND TEST GRAB WIRE BOARD AND WIDE BAND TEST DEVICE
有权
HOLD线单元用于宽带测试,HOLD线板宽带测试和宽带测试仪
- 专利标题: WIDE BAND TEST GRAB WIRE UNIT, WIDE BAND TEST GRAB WIRE BOARD AND WIDE BAND TEST DEVICE
- 专利标题(中): HOLD线单元用于宽带测试,HOLD线板宽带测试和宽带测试仪
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申请号: EP05766865.9申请日: 2005-07-20
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公开(公告)号: EP1760903B1公开(公告)日: 2008-12-10
- 发明人: YAN, Zhiguo , XIAO, Ruijie , ZHOU, Jun , YANG, Tao
- 申请人: Huawei Technologies Co., Ltd.
- 申请人地址: Huawei Administration Building, Bantain Longgang District, Shenzhen Guangdong 518129 CN
- 专利权人: Huawei Technologies Co., Ltd.
- 当前专利权人: Huawei Technologies Co., Ltd.
- 当前专利权人地址: Huawei Administration Building, Bantain Longgang District, Shenzhen Guangdong 518129 CN
- 代理机构: Colombo, Michel
- 优先权: CN200410054821 20040722
- 国际公布: WO2006007790 20060126
- 主分类号: H04M3/30
- IPC分类号: H04M3/30 ; H04B1/74
摘要:
The present invention discloses a wide band test grab wire unit, a wide band test grab wire board and a wide band test device. The said wide band test grab wire unit, comprises the first, second and third test end, signal separator (14), the first, second and third switch, and the first, second and third interface end; the said wide band test grab wire board, comprises at least two wide band test grab wire units and internal test bus groups, and the forth, fifth and sixth switch, the said internal test bus group comprises internal inter-test bus, internal extra-test bus and internal secondary test bus; the said wide band test device, comprises at least one wide band test grab wire board, the eighth and ninth switch, test control module, and the external inter-test bus and external extra-test bus, the said buses are connected with the said test control module; the said wide band test device in present invention has simple structure and low cost, and N+1 copy function can be implemented easily between the ends inside the board, the reliability of communication can be further increased.
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