发明授权
EP1794553B1 RADIATION MEASURING DEVICE, RADIATION CONTROL SYSTEM, AND RADIATION MEASURING METHOD
有权
辐射测量设备,辐射控制装置,射线测量方法
- 专利标题: RADIATION MEASURING DEVICE, RADIATION CONTROL SYSTEM, AND RADIATION MEASURING METHOD
- 专利标题(中): 辐射测量设备,辐射控制装置,射线测量方法
-
申请号: EP05790683.6申请日: 2005-09-06
-
公开(公告)号: EP1794553B1公开(公告)日: 2012-05-02
- 发明人: MARTENS, Christiaan, J.
- 申请人: Koninklijke Philips Electronics N.V.
- 申请人地址: Groenewoudseweg 1 5621 BA Eindhoven NL
- 专利权人: Koninklijke Philips Electronics N.V.
- 当前专利权人: Koninklijke Philips Electronics N.V.
- 当前专利权人地址: Groenewoudseweg 1 5621 BA Eindhoven NL
- 代理机构: Bosma, Rudolphus Hubertus Antonius
- 优先权: EP04104452 20040915
- 国际公布: WO2006030345 20060323
- 主分类号: G01J1/04
- IPC分类号: G01J1/04 ; G01J5/12 ; G01J5/10
摘要:
The invention provides a device for measuring radiation, as well as a method for measuring with the device, and a controllable lighting system with the device. The device (l') has a side wall (2) with a sensor (5, 5'), a radiation entrance opening (4'), and optionally a top wall (9) and bottom cap (10). The sensor is sensitive only to indirect radiation that is reflected at a reflection area, such as a ring (12a - 12b). The device is not sensitive to dust deposition, because most dust is blocked by the side wall (2), while any other dust will pass the sensor surface and reflection area(s) on air currents parallel thereto, without any deposition of dust or dirt. Hence the sensor will give more reliable measurements, even in dusty environments. The method involves orienting the device with respect to the light to be measured and to possible currents. The controllable lighting system involves measuring light levels with the device, and having a control unit control one or more lamps on the basis of those measurements.
公开/授权文献
信息查询