发明公开
EP1820887A2 Gallium nitride crystal substrate and method of producing same
审中-公开
Substrat aus Galliumnitridkristall und Verfahren zu seiner Herstellung
- 专利标题: Gallium nitride crystal substrate and method of producing same
- 专利标题(中): Substrat aus Galliumnitridkristall und Verfahren zu seiner Herstellung
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申请号: EP06023148.7申请日: 2006-11-07
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公开(公告)号: EP1820887A2公开(公告)日: 2007-08-22
- 发明人: Sato, Fumitaka , Nakahata, Seiji
- 申请人: Sumitomo Electric Industries, Ltd.
- 申请人地址: 5-33, Kitahama 4-chome, Chuo-ku Osaka JP
- 专利权人: Sumitomo Electric Industries, Ltd.
- 当前专利权人: Sumitomo Electric Industries, Ltd.
- 当前专利权人地址: 5-33, Kitahama 4-chome, Chuo-ku Osaka JP
- 代理机构: Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
- 优先权: JP2006041140 20060217
- 主分类号: C30B29/40
- IPC分类号: C30B29/40 ; C30B25/04
摘要:
A low-distortion gallium nitride crystal substrate including low dislocation single crystal regions (Z) having a definite c-axis and a definite a-axis, C-plane growth regions (Y) having a c-axis and a-axis parallel to the c-axis and a-axis of the low dislocation single crystal regions (Z), voluminous defect accumulating regions (H) having a c-axis inverse to the c-axis of the low dislocation single crystal regions (Z) and an a-axis parallel with the a-axis of the low dislocation single crystal regions (Z), and 0.1/cm 2 to 10/cm 2 c-axis gross core regions (F) containing at least one crystal having a c-axis parallel to the c-axis of the low dislocation single crystal regions (Z) and an a-axis different from the a-axis of the low dislocation single crystal regions (Z).
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