- 专利标题: COMPUTER QC MODULE TESTING MONITOR
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申请号: EP05733179.5申请日: 2005-03-03
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公开(公告)号: EP1859365B1公开(公告)日: 2018-09-26
- 发明人: NARAYAN, Ranjani , VARADARAJAN, Keshavan , NATANASABAPATHY, Gautham
- 申请人: Hewlett Packard Enterprise Development LP
- 申请人地址: 11445 Compaq Center Drive West Houston, TX 77070 US
- 专利权人: Hewlett Packard Enterprise Development LP
- 当前专利权人: Hewlett Packard Enterprise Development LP
- 当前专利权人地址: 11445 Compaq Center Drive West Houston, TX 77070 US
- 代理机构: Lawman, Matthew John Mitchell
- 国际公布: WO2006092806 20060908
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
The computer availability is predicted by determining a hazard fail rate for the computer system that is based on the hazard fail rate of the individual computer components and the computer system structure s6, as well as the mean repair rate for the system. The computer hazard rates of individual computer system components are based on the error monitoring of those computer components during the computer system operation in real time.
公开/授权文献
- EP1859365A1 COMPUTER QC MODULE TESTING MONITOR 公开/授权日:2007-11-28
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