发明授权
- 专利标题: SOLID STATE IMAGING DEVICE
- 专利标题(中): SEMICONDUCTORS成像元件
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申请号: EP06731667.9申请日: 2006-04-12
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公开(公告)号: EP1874044B1公开(公告)日: 2016-10-12
- 发明人: SUGIYAMA, Yukinobu , MIZUNO, Seiichiro
- 申请人: HAMAMATSU PHOTONICS K.K.
- 申请人地址: 1126-1 Ichino-cho Hamamatsu-shi, Shizuoka-ken 435-8558 JP
- 专利权人: HAMAMATSU PHOTONICS K.K.
- 当前专利权人: HAMAMATSU PHOTONICS K.K.
- 当前专利权人地址: 1126-1 Ichino-cho Hamamatsu-shi, Shizuoka-ken 435-8558 JP
- 代理机构: Boult Wade Tennant
- 优先权: JP2005117388 20050414
- 国际公布: WO2006112314 20061026
- 主分类号: H04N5/335
- IPC分类号: H04N5/335 ; H01L27/146
摘要:
A solid-state imaging device 1 is provided with (1) a photodetecting section 11 in which MxN of pixels are two-dimensionally arranged in M rows and N columns, and a pixel P m,n at the m-th row and the n-th column includes a photodiode PD1 m , n , (2) a row selecting section 20 that selects one or more rows, out of M rows of the photodetecting section 11, instructs each pixel in the selected rows to accumulate an electric charge generated in the photodiode PD1 m,n in response to the incidence of light, and instructs to output data corresponding to the amount of accumulated electric charge of each pixel by each row of the photodetecting section 11, and (3) a first signal processing section 30 that inputs data of each pixel, outputted by each row of the photodetecting section 11 by an instruction from the row selecting section 20, and outputs the data by each pixel.
公开/授权文献
- EP1874044A1 SOLID STATE IMAGING DEVICE 公开/授权日:2008-01-02
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