发明公开
- 专利标题: Microscope examination apparatus
- 专利标题(中): 显微镜检查装置
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申请号: EP07020919.2申请日: 2007-01-03
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公开(公告)号: EP1882971A3公开(公告)日: 2008-11-26
- 发明人: Fukuyama, Hiroya , Tanikawa, Yoshihisa , Hirata, Tadashi , Takahashi, Seiya
- 申请人: Olympus Corporation
- 申请人地址: 43-2, Hatagaya 2-chome Shibuya-ku Tokyo 151-0072 JP
- 专利权人: Olympus Corporation
- 当前专利权人: Olympus Corporation
- 当前专利权人地址: 43-2, Hatagaya 2-chome Shibuya-ku Tokyo 151-0072 JP
- 代理机构: von Hellfeld, Axel
- 优先权: JP2006004881 20060112; JP2006055060 20060301
- 主分类号: G02B21/24
- IPC分类号: G02B21/24 ; G02B21/36 ; G02B27/64
摘要:
The invention provides a microscope examination apparatus for observing a specimen of a living organism that exhibits dynamic behaviour, the microscope examination apparatus comprising: a first image-acquisition device (8) configured to image the specimen of the living organism; a second image-acquisition device (9) configured to image the specimen of the living organism, the second image-acquisition device (9) having a higher speed of acquiring images than the first image-acquisition device (8) for acquiring images; and a control apparatus (18) configured to carry out image processing of an image which is acquired by the second image-acquisition device (9) and to calculate a command signal to correct image blur of an image which is acquired by the first image-acquisition device (8).
公开/授权文献
- EP1882971A2 Microscope examination apparatus 公开/授权日:2008-01-30
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