发明公开
EP1946375A1 HIGHLY MANUFACTURABLE SRAM CELLS IN SUBSTRATES WITH HYBRID CRYSTAL ORIENTATION
有权
HOCHPRODUZIERBARE在基底板混合杂交中的SRAM-ZELLEN
- 专利标题: HIGHLY MANUFACTURABLE SRAM CELLS IN SUBSTRATES WITH HYBRID CRYSTAL ORIENTATION
- 专利标题(中): HOCHPRODUZIERBARE在基底板混合杂交中的SRAM-ZELLEN
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申请号: EP06777968.6申请日: 2006-07-25
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公开(公告)号: EP1946375A1公开(公告)日: 2008-07-23
- 发明人: DORIS, Bruce , COSTRINI, Gregory , GLUSCHENKOV, Oleg , LEONG, Meikei , SEONG, Nakgeuon
- 申请人: International Business Machines Corporation
- 申请人地址: New Orchard Road Armonk, NY 10504 US
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: New Orchard Road Armonk, NY 10504 US
- 代理机构: Williams, Julian David
- 优先权: US162780 20050922
- 国际公布: WO2007039333 20070412
- 主分类号: H01L27/11
- IPC分类号: H01L27/11 ; H01L21/8244
摘要:
The present invention relates to a semiconductor device structure that includes at least one SRAM cell formed in a substrate. Such SRAM cell comprises two pull-up transistors, two pull-down transistors, and two pass-gate transistors. The pull-down transistors and the pass-gate transistors are substantially similar in channel widths and have substantially similar source-drain doping concentrations, while the SRAM cell has a beta ratio of at least 1.5. The substrate preferably comprises a hybrid substrate with at two isolated sets of regions, while carrier mobility in these two sets of regions differentiates by a factor of at least about 1.5. More preferably, the pull-down transistors of the SRAM cell are formed in one set of regions, and the pass-gate transistors are formed in the other set of regions, so that current flow in the pull-down transistors is larger than that in the pass-gate transistors.
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