发明公开
EP1974412A1 APPARATUS FOR MEASURING AN ELECTRICAL CHARACTERISTIC OF AN ELECTROCHEMICAL DEVICE 审中-公开
用于测量的电化学装置的电气特性尺寸

  • 专利标题: APPARATUS FOR MEASURING AN ELECTRICAL CHARACTERISTIC OF AN ELECTROCHEMICAL DEVICE
  • 专利标题(中): 用于测量的电化学装置的电气特性尺寸
  • 申请号: EP06845931.2
    申请日: 2006-12-19
  • 公开(公告)号: EP1974412A1
    公开(公告)日: 2008-10-01
  • 发明人: WARDROP, David, S.
  • 申请人: Ballard Power Systems Inc.
  • 申请人地址: 9000 Glenlyon Parkway Burnaby, BC V5J 5J8 CA
  • 专利权人: Ballard Power Systems Inc.
  • 当前专利权人: Ballard Power Systems Inc.
  • 当前专利权人地址: 9000 Glenlyon Parkway Burnaby, BC V5J 5J8 CA
  • 代理机构: Beyer, Andreas
  • 优先权: US322833 20051230
  • 国际公布: WO2007078976 20070712
  • 主分类号: H01M8/04
  • IPC分类号: H01M8/04 H01M8/24
APPARATUS FOR MEASURING AN ELECTRICAL CHARACTERISTIC OF AN ELECTROCHEMICAL DEVICE
摘要:
Measurement systems for electrochemical devices employ a semi-conductive measurement strip that can be coupled to the electrochemical device to indicate an electrical characteristic of the electrochemical device. The measurement systems may further include electrical contactors and/or measurement devices. Methods for monitoring cells of an electrochemical device are disclosed for monitoring and analyzing the change over distance of the voltages of the electrochemical device.
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