发明公开
EP1995591A3 Flexible array probe for the inspection of a contoured surface with varying cross-sectional geometry
有权
用于检查具有不同的横截面几何形状的轮廓表面的柔性阵列探针
- 专利标题： Flexible array probe for the inspection of a contoured surface with varying cross-sectional geometry
- 专利标题（中）： 用于检查具有不同的横截面几何形状的轮廓表面的柔性阵列探针
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申请号： EP08156689.5申请日： 2008-05-21
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公开(公告)号： EP1995591A3公开(公告)日： 2013-01-02
- 发明人: LEPAGE, Benoit , ROY, Martin , ORSI, Stefano
- 申请人： Olympus NDT
- 申请人地址： 48 Woerd Avenue Waltham, MA 02453 US
- 专利权人： Olympus NDT
- 当前专利权人： Olympus NDT
- 当前专利权人地址： 48 Woerd Avenue Waltham, MA 02453 US
- 代理机构： Franzolin, Luigi
- 优先权： US939171P 20070521
- 主分类号： G01N27/90
- IPC分类号： G01N27/90 ; G01N27/87 ; G01N29/22
摘要：
A flexible array probe is disclosed suitable for use in the non-destructive testing and inspection of test pieces with varying cross-sectional geometries. Array elements (103) such as, but not limited to, eddy current sensors, piezoelectric sensor elements, and magnetic flux leakage sensors--are mounted on thin alignment fins (101) and coupled together with pairs of pivot mechanisms along the axis of desired rotation. The pivot mechanisms allow rotation in exactly one dimension and force the flexible array probe to align its elements orthogonally to the surface of the structure under test. Alignment and coupling fixtures arc also disclosed.
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