发明公开
- 专利标题: Specimen rack and specimen carrier system
- 专利标题(中): Probenregal和Probenträgersystem
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申请号: EP08009836.1申请日: 2008-05-29
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公开(公告)号: EP2000211A1公开(公告)日: 2008-12-10
- 发明人: Noguchi, Koyiteru , Ohtake, Hitoshi , Takagi, Yoshimitsu , Yamaguchi, Takuya , Saito, Yoshiaki , Takebe, Yasuaki
- 申请人: Hitachi High-Technologies Corporation
- 申请人地址: 24-14, Nishishimbashi 1-chome, Minato-ku Tokyo 105-8717 JP
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: 24-14, Nishishimbashi 1-chome, Minato-ku Tokyo 105-8717 JP
- 代理机构: Strehl Schübel-Hopf & Partner
- 优先权: JP2007142775 20070530
- 主分类号: B01L9/06
- IPC分类号: B01L9/06
摘要:
A specimen rack (1) and a specimen carrier system includes a luminous body (2) disposed on a vicinity of a specimen container loading slot (3) to notify, to an operator, information concerning an analyzing situation and condition of the specimen contained in the specimen container held by the specimen rack.
公开/授权文献
- EP2000211B1 Specimen rack and specimen carrier system 公开/授权日:2014-06-04
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