发明公开
- 专利标题: Image measurement apparatus
- 专利标题(中): 图像测量设备
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申请号: EP08157693.6申请日: 2008-06-05
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公开(公告)号: EP2031558A3公开(公告)日: 2010-07-28
- 发明人: Kochi, Nobuo , Anai, Tetsuharu , Ohtani, Hitoshi
- 申请人: Kabushiki Kaisha TOPCON
- 申请人地址: 75-1, Hasunuma-cho, Itabashi-ku Tokyo 174-8580 JP
- 专利权人: Kabushiki Kaisha TOPCON
- 当前专利权人: Kabushiki Kaisha TOPCON
- 当前专利权人地址: 75-1, Hasunuma-cho, Itabashi-ku Tokyo 174-8580 JP
- 代理机构: Vinsome, Rex Martin
- 优先权: JP2007222002 20070829
- 主分类号: G06T7/00
- IPC分类号: G06T7/00 ; G06T3/40 ; G06T5/50
摘要:
A measurement processing block obtains a plurality of first images of the object to be measured, taken with very small movements in the imaging area. A feature extraction processing block extracts an approximate feature portion of the object from the first images obtained by the measurement processing block. A partial-image creation processing block creates a plurality of first partial images by grouping the plurality of first images obtained by the measurement processing block in the vicinity of the approximate feature portion extracted by the feature extraction processing block. A super-resolution-image creation processing block creates a super-resolution image from the plurality of first partial images created by the partial-image creation processing block. Thus, detailed features of the object are measured precisely and easily even when the object is located far away.
公开/授权文献
- EP2031558A2 Image measurement apparatus 公开/授权日:2009-03-04
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