发明公开
- 专利标题： Sample analyzer
- 专利标题（中）： Probenanalysegerät
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申请号： EP08015115.2申请日： 2008-08-27
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公开(公告)号： EP2037281A2公开(公告)日： 2009-03-18
- 发明人: Mizumoto, Toru , Ebi, Ryuichiro , Tsutsumida, Keisuke , Tanaka, Yousuke , Inoue, Junya
- 申请人： SYSMEX CORPORATION
- 申请人地址： 5-1, Wakinohama-Kaigandori 1-chome, Chuo-ku Kobe-shi, Hyogo 651-0073 JP
- 专利权人： SYSMEX CORPORATION
- 当前专利权人： SYSMEX CORPORATION
- 当前专利权人地址： 5-1, Wakinohama-Kaigandori 1-chome, Chuo-ku Kobe-shi, Hyogo 651-0073 JP
- 代理机构： HOFFMANN EITLE
- 优先权： JP2007237344 20070913; JP2007240638 20070918
- 主分类号： G01N35/00
- IPC分类号： G01N35/00
摘要：
A sample analyzer is disclosed that comprises: an analysis section for analyzing a sample by using a reagent; an information receiver for receiving an input of information regarding the reagent; a determination section for determining, whether or not the reagent satisfies a condition to determine that the reagent is a genuine product, based on the information received by the information receiver; and a controller for controlling an operation of the sample analyzer based on a result of the determination by the determination section.
公开/授权文献
- EP2037281B1 Sample analyzer 公开/授权日：2018-10-10
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