发明公开
- 专利标题： A test station for testing leakage current through the insulating package of power electronic components, and a corresponding method
- 专利标题（中）： 测试通过功率电子部件和相应方法的绝缘测试漏电流
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申请号： EP07119668.7申请日： 2007-10-30
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公开(公告)号： EP2056117A1公开(公告)日： 2009-05-06
- 发明人: Charpié, Michel , Cretenet, Davy
- 申请人： ISMECA Semiconductor Holding SA
- 申请人地址： Rue de l'Helvétie 283 2300 La Chaux-de-Fonds CH
- 专利权人： ISMECA Semiconductor Holding SA
- 当前专利权人： ISMECA Semiconductor Holding SA
- 当前专利权人地址： Rue de l'Helvétie 283 2300 La Chaux-de-Fonds CH
- 代理机构： P&TS Patents & Technology Surveys SA
- 主分类号： G01R31/12
- IPC分类号： G01R31/12 ; G01R31/26 ; G01R31/28 ; G01R31/02
摘要：
A test station (6) for testing leakage current through the insulating package (42) of power electronic components (3), said test station comprising:
first contact portions (36) for applying a first test voltage on one or more pins (40) of said tested components,
second contact portions (24, 37, 370, 25, 26) for applying a second test voltage on several external faces of said insulating package of said tested components,
characterized in that said second contact portions are arranged for contacting several mutually orthogonal faces of said power electronic components (3).
first contact portions (36) for applying a first test voltage on one or more pins (40) of said tested components,
second contact portions (24, 37, 370, 25, 26) for applying a second test voltage on several external faces of said insulating package of said tested components,
characterized in that said second contact portions are arranged for contacting several mutually orthogonal faces of said power electronic components (3).
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