发明公开
EP2064578A1 VERFAHREN ZUR UNTERSUCHUNG EINES OBJEKTS MIT EINEM MIKROSKOP UND EIN MIKROSKOP
审中-公开
步骤中使用的显微镜和显微镜的对象
- 专利标题: VERFAHREN ZUR UNTERSUCHUNG EINES OBJEKTS MIT EINEM MIKROSKOP UND EIN MIKROSKOP
- 专利标题(英): Method for examining a specimen using a microscope and a microscope
- 专利标题(中): 步骤中使用的显微镜和显微镜的对象
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申请号: EP07788340.3申请日: 2007-08-09
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公开(公告)号: EP2064578A1公开(公告)日: 2009-06-03
- 发明人: SIECKMANN, Frank
- 申请人: Leica Microsystems CMS GmbH
- 申请人地址: Ernst-Leitz-Strasse 17-37 35578 Wetzlar DE
- 专利权人: Leica Microsystems CMS GmbH
- 当前专利权人: Leica Microsystems CMS GmbH
- 当前专利权人地址: Ernst-Leitz-Strasse 17-37 35578 Wetzlar DE
- 代理机构: Hassenbürger, Anneliese
- 优先权: DE102006042242 20060906
- 国际公布: WO2008028745 20080313
- 主分类号: G02B21/36
- IPC分类号: G02B21/36
摘要:
A method for examining a specimen using a microscope, in particular a confocal scanning microscope, has the following steps. First, a scanning region, containing a specimen to be examined or a plurality of specimens to be examined, in a predeterminable spatial direction is selected. Then, a series of images in the scanning region along the spatial direction are recorded such that the individual images can be uniquely assigned to individual planes in the spatial direction. Then, an image analysis method is selected with at least one predeterminable criterion with respect to the specimen to be examined or the specimens to be examined. Finally, the image analysis method is applied to the individual planes for ascertaining a preferred plane which at least to a great extent satisfies the predeterminable criterion or criteria. Furthermore, a microscope for carrying out the method is specified.
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