发明公开
- 专利标题: Resolver abnormality detection circuit
- 专利标题(中): 旋转异常检测电路
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申请号: EP09000230.4申请日: 2009-01-09
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公开(公告)号: EP2078933A3公开(公告)日: 2011-01-05
- 发明人: Kanekawa, Nobuyasu , Kobayashi, Ryoichi , Koseki, Tomonobu
- 申请人: Hitachi, Ltd.
- 申请人地址: 6-6, Marunouchi 1-chome Chiyoda-ku Tokyo 100-8280 JP
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: 6-6, Marunouchi 1-chome Chiyoda-ku Tokyo 100-8280 JP
- 代理机构: MERH-IP Matias Erny Reichl Hoffmann
- 优先权: JP2008001752 20080109
- 主分类号: G01D5/244
- IPC分类号: G01D5/244 ; G01D5/20
摘要:
An abnormality detection circuit for a resolver outputs a rotation angle signal 101 corresponding to a rotation angle of a rotor from a resolver winding 102. In the abnormality detection circuit, the resolver abnormality detection circuit applies a specified signal to one terminal of the resolver winding 102, determines whether the specified signal is superimposed on the rotation angle signal 101 outputted by an other terminal of the resolver winding 102, and detects abnormalities of the resolver based on results of the determination.
公开/授权文献
- EP2078933A2 Resolver abnormality detection circuit 公开/授权日:2009-07-15
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