发明公开
- 专利标题: Physical quantity sensor and physical quantity measuring method
- 专利标题(中): 物理量传感器和物理量测量方法
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申请号: EP09151633.6申请日: 2009-01-29
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公开(公告)号: EP2085789A3公开(公告)日: 2011-07-06
- 发明人: Ueno, Tatsuya
- 申请人: Yamatake Corporation
- 申请人地址: 2-7-3 Marunouchi, Chiyoda-ku Tokyo 100-6419 JP
- 专利权人: Yamatake Corporation
- 当前专利权人: Yamatake Corporation
- 当前专利权人地址: 2-7-3 Marunouchi, Chiyoda-ku Tokyo 100-6419 JP
- 代理机构: Blot, Philippe Robert Emile
- 优先权: JP2008020712 20080131
- 主分类号: G01S7/491
- IPC分类号: G01S7/491 ; G01S17/32 ; G01S17/58
摘要:
A physical quantity sensor has a semiconductor laser, a laser driver for providing, to the semiconductor laser, a driving electric current that is a waveform wherein the maximum portions and minimum portions of a triangle wave have been rounded; detecting means (a photodiode and a current-voltage converting amplifier) for detecting an electric signal that includes an interference waveform that is produced by the self-coupling effect between a laser beam that is emitted from the semiconductor laser and a return beam from a measurement object; and measuring means (a filter circuit, a counting device, and a calculating device) for calculating a physical quantity for the measurement object from interference waveform information.
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