发明公开
EP2093883A1 Method and apparatus for AD conversion, semiconductor device for detecting distribution of physical quantity, and electronic apparatus 有权
对于A / D转换,用于检测物理量分布的半导体电路和电子设备的方法和装置

  • 专利标题: Method and apparatus for AD conversion, semiconductor device for detecting distribution of physical quantity, and electronic apparatus
  • 专利标题(中): 对于A / D转换,用于检测物理量分布的半导体电路和电子设备的方法和装置
  • 申请号: EP09006415.5
    申请日: 2005-02-21
  • 公开(公告)号: EP2093883A1
    公开(公告)日: 2009-08-26
  • 发明人: Muramatsu, YoshinoriFukushima, NoriyukiNitta, YoshikazuYasui, Yukihiro
  • 申请人: Sony Corporation
  • 申请人地址: 1-7-1 Konan Minato-ku Tokyo 108-0075 JP
  • 专利权人: Sony Corporation
  • 当前专利权人: Sony Corporation
  • 当前专利权人地址: 1-7-1 Konan Minato-ku Tokyo 108-0075 JP
  • 代理机构: Zinke, Thomas
  • 优先权: JP2004045942 20040223; JP2004110866 20040405
  • 主分类号: H03M1/10
  • IPC分类号: H03M1/10 H04N3/15
Method and apparatus for AD conversion, semiconductor device for detecting distribution of physical quantity, and electronic apparatus
摘要:
A column analog-to-digital converter having a voltage comparator and a counter is arranged for each a vertical signal line. The voltage comparator compares a pixel signal inputted via the vertical signal line at each row control signal line with a reference voltage, thereby generating a pulse signal having a length in time axis corresponding to the magnitude of a reset component and a signal component. The counter counts a clock to measure the width of the pulse signal until the end of the comparison operation of the comparator, and stores a count at the end of the comparison. A communication and timing controller controls the voltage comparator and the counter so that, in a first process, the voltage comparator performs a comparison operation on a reset component with the counter performing a down-counting operation, and so that, in a second process, the voltage controller performs the comparison operation on a signal component with the counter performing an up-counting operation.
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