发明公开
EP2096404A3 Target and three-dimensional-shape measurement device using the same
有权
使用目标的三维轮廓的目标和测量装置
- 专利标题: Target and three-dimensional-shape measurement device using the same
- 专利标题(中): 使用目标的三维轮廓的目标和测量装置
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申请号: EP09153921.3申请日: 2009-02-27
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公开(公告)号: EP2096404A3公开(公告)日: 2013-07-24
- 发明人: Ootani, Hitoshi , Ito, Tadayuki
- 申请人: Kabushiki Kaisha TOPCON
- 申请人地址: 75-1, Hasunuma-cho, Itabashi-ku Tokyo 174-8580 JP
- 专利权人: Kabushiki Kaisha TOPCON
- 当前专利权人: Kabushiki Kaisha TOPCON
- 当前专利权人地址: 75-1, Hasunuma-cho, Itabashi-ku Tokyo 174-8580 JP
- 代理机构: Ilgart, Jean-Christophe
- 优先权: JP2008047039 20080228
- 主分类号: G01C11/00
- IPC分类号: G01C11/00 ; G01C15/00
摘要:
A target set in a to-be-measured object and used for acquiring a reference value of point-cloud data, the target includes a small circle surrounded by a frame and having the center of the target, a large circle surrounded by the frame and disposed concentrically with the small circle so as to surround the small circle, a low-luminance reflective region located between the frame and the large circle and having the lowest reflectivity, a high-luminance reflective region located between the large circle and the small circle and having the highest reflectivity, and an intermediate-luminance reflective region located inside the small circle and having an intermediate reflectivity which is higher than the reflectivity of time low-luminance reflective region and which is lower than the reflectivity of the high-luminance reflective region.
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