发明授权
- 专利标题: OPTICAL ELEMENT FOR X-RAY MICROSCOPY
- 专利标题(中): 光学元件,用于X射线显微镜,
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申请号: EP08773243.4申请日: 2008-06-19
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公开(公告)号: EP2168130B1公开(公告)日: 2012-06-06
- 发明人: CHADZITASKOS, Goce
- 申请人: Ceské Vysoké Ucení Technické V Praze
- 申请人地址: Fakulta Jaderná a Fyzikálne In en rská Brehová 7 115 19 Praha CZ
- 专利权人: Ceské Vysoké Ucení Technické V Praze
- 当前专利权人: Ceské Vysoké Ucení Technické V Praze
- 当前专利权人地址: Fakulta Jaderná a Fyzikálne In en rská Brehová 7 115 19 Praha CZ
- 代理机构: Duskova, Hana
- 优先权: CZ20070494 20070720
- 国际公布: WO2009012732 20090129
- 主分类号: G21K1/06
- IPC分类号: G21K1/06
摘要:
Optical set-up displaying X-ray radiation with wavelength ? consists of monocrystal (1) with atomic planes (2) in parallel with optical axis (3). The mutual distance of the atomic planes in resting state without the force is d0. Cross section (S) of the monocrystal (1) is variable. With respect to the optical axis (3) the farther and/or closer side of monocrystal (1), which is orthogonal to this optical axis (3), is equipped with a device creating and maintaining pull or push force (F) in direction orthogonal to atomic planes (2) of such monocrystal (1).
公开/授权文献
- EP2168130A2 OPTICAL ELEMENT FOR X-RAY MICROSCOPY 公开/授权日:2010-03-31
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