发明公开
- 专利标题: VERFAHREN ZUR VERBESSERUNG DER MATERIALERKENNBARKEIT IN EINER RÖNTGENPRÜFANLAGE UND RÖNTGENPRÜFANLAGE
- 专利标题(英): Method for improving the ability to detect materials in an x-ray test system, and x-ray test system
- 专利标题(中): 方法改善材料识别和X射线检查的X射线的
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申请号: EP08785285.1申请日: 2008-08-01
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公开(公告)号: EP2185920A1公开(公告)日: 2010-05-19
- 发明人: SIEDENBURG, Uwe
- 申请人: Smiths Heimann GmbH
- 申请人地址: Im Herzen 4 65205 Wiesbaden DE
- 专利权人: Smiths Heimann GmbH
- 当前专利权人: Smiths Heimann GmbH
- 当前专利权人地址: Im Herzen 4 65205 Wiesbaden DE
- 代理机构: Thul, Hermann
- 优先权: DE102007042144 20070905
- 国际公布: WO2009030326 20090312
- 主分类号: G01N23/04
- IPC分类号: G01N23/04 ; G01N23/08
摘要:
Method for improving the ability to detect materials in an X-ray test system, having the following method steps - at least two absorption X-ray images of an object to be investigated are recorded at different energies - the object is mathematically modelled by means of a number of layers, assuming a specific material for each layer, wherein an absorption value describes the absorptivity of a layer, the number of layers is less than or equal to the number of X-ray images and a material to be detected during the test is assumed for at least one layer - the absorption value for each layer is broken down into a travel-dependent factor and an energy-dependent factor - the travel-dependent factors for all layers are calculated from the absorption X-ray images by means of the absorption equation - at least one synthetic image is calculated from the sum of the absorption values for all layers, which absorption values have been multiplied by weighting factors - the synthetic image is evaluated.
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