发明公开
EP2185920A1 VERFAHREN ZUR VERBESSERUNG DER MATERIALERKENNBARKEIT IN EINER RÖNTGENPRÜFANLAGE UND RÖNTGENPRÜFANLAGE 审中-公开
方法改善材料识别和X射线检查的X射线的

  • 专利标题: VERFAHREN ZUR VERBESSERUNG DER MATERIALERKENNBARKEIT IN EINER RÖNTGENPRÜFANLAGE UND RÖNTGENPRÜFANLAGE
  • 专利标题(英): Method for improving the ability to detect materials in an x-ray test system, and x-ray test system
  • 专利标题(中): 方法改善材料识别和X射线检查的X射线的
  • 申请号: EP08785285.1
    申请日: 2008-08-01
  • 公开(公告)号: EP2185920A1
    公开(公告)日: 2010-05-19
  • 发明人: SIEDENBURG, Uwe
  • 申请人: Smiths Heimann GmbH
  • 申请人地址: Im Herzen 4 65205 Wiesbaden DE
  • 专利权人: Smiths Heimann GmbH
  • 当前专利权人: Smiths Heimann GmbH
  • 当前专利权人地址: Im Herzen 4 65205 Wiesbaden DE
  • 代理机构: Thul, Hermann
  • 优先权: DE102007042144 20070905
  • 国际公布: WO2009030326 20090312
  • 主分类号: G01N23/04
  • IPC分类号: G01N23/04 G01N23/08
VERFAHREN ZUR VERBESSERUNG DER MATERIALERKENNBARKEIT IN EINER RÖNTGENPRÜFANLAGE UND RÖNTGENPRÜFANLAGE
摘要:
Method for improving the ability to detect materials in an X-ray test system, having the following method steps - at least two absorption X-ray images of an object to be investigated are recorded at different energies - the object is mathematically modelled by means of a number of layers, assuming a specific material for each layer, wherein an absorption value describes the absorptivity of a layer, the number of layers is less than or equal to the number of X-ray images and a material to be detected during the test is assumed for at least one layer - the absorption value for each layer is broken down into a travel-dependent factor and an energy-dependent factor - the travel-dependent factors for all layers are calculated from the absorption X-ray images by means of the absorption equation - at least one synthetic image is calculated from the sum of the absorption values for all layers, which absorption values have been multiplied by weighting factors - the synthetic image is evaluated.
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