发明公开
- 专利标题: CALIBRATION SOURCE ASSEMBLY FOR AN INFRARED DETECTOR
- 专利标题(中): 校准源安排红外探测器
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申请号: EP08853931.7申请日: 2008-10-29
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公开(公告)号: EP2205951A1公开(公告)日: 2010-07-14
- 发明人: MOSKUN, Eric, M. , COOK, Lacy, G. , DE RUYTER, Howard, M.
- 申请人: Raytheon Company
- 申请人地址: 870 Winter Street Waltham, MA 02451-1449 US
- 专利权人: Raytheon Company
- 当前专利权人: Raytheon Company
- 当前专利权人地址: 870 Winter Street Waltham, MA 02451-1449 US
- 代理机构: Zanoli, Enrico
- 优先权: US978738 20071030
- 国际公布: WO2009070408 20090604
- 主分类号: G01J5/52
- IPC分类号: G01J5/52 ; G02B13/14
摘要:
A calibration source IR assembly (100) for an IR detector (102) includes an IR focal plane (116). The calibration assembly (100) includes a rotatable spectral filter wheel (118) optically coupled to an IR focal plane (116) of the detector (102), the filter wheel (118) having a plurality of areas each of at least a minimum size. At least one area being a calibration area (120), the calibration area (120) including: a substrate (122) having a first side (124) facing the IR focal plane (116) and a second side (126) opposite from the first side (124); a light transmitting edge section (128) disposed between the first side (124) and the second side (126); and at least one light redirector (130) disposed at least partially within the substrate (122), the light redirector (130) structured and arranged to receive light from the edge (128) and to redirect the light out the first side (124). A light source (132) optically coupled to the edge section (128). An IR detector (102) including the improvement of such a calibration source (120) IR assembly (100) is also provided.
公开/授权文献
- EP2205951B1 CALIBRATION SOURCE ASSEMBLY FOR AN INFRARED DETECTOR 公开/授权日:2011-11-23
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