发明公开
EP2206130A1 HIGH PERMITTIVITY LOW LEAKAGE CAPACITOR AND ENERGY STORING DEVICE AND METHOD FOR FORMING THE SAME 有权
随着对生产高,低压泄漏介电常数度与能量存储装置与方法电容器

  • 专利标题: HIGH PERMITTIVITY LOW LEAKAGE CAPACITOR AND ENERGY STORING DEVICE AND METHOD FOR FORMING THE SAME
  • 专利标题(中): 随着对生产高,低压泄漏介电常数度与能量存储装置与方法电容器
  • 申请号: EP08835074.9
    申请日: 2008-10-03
  • 公开(公告)号: EP2206130A1
    公开(公告)日: 2010-07-14
  • 发明人: Carver, David
  • 申请人: Carver, David
  • 申请人地址: 4419 Centennial Blvd 201 Colorado Springs, CO 80907 US
  • 专利权人: Carver, David
  • 当前专利权人: Carver, David
  • 当前专利权人地址: 4419 Centennial Blvd 201 Colorado Springs, CO 80907 US
  • 代理机构: Bartle, Robin Jonathan
  • 优先权: US978067P 20071005
  • 国际公布: WO2009046341 20090409
  • 主分类号: H01G4/10
  • IPC分类号: H01G4/10
HIGH PERMITTIVITY LOW LEAKAGE CAPACITOR AND ENERGY STORING DEVICE AND METHOD FOR FORMING THE SAME
摘要:
A method is provided for making a high permittivity dielectric material for use in capacitors. Several high permittivity materials in an organic nonconductive media with enhanced properties and methods for making the same are disclosed. A general method for the formation of thin films of some particular dielectric material is disclosed, wherein the use of organic polymers, shellac, silicone oil, and/or zein formulations are utilized to produce low conductivity dielectric coatings. Additionally, a method whereby the formation of certain transition metal salts as salt or oxide matrices is demonstrated at low temperatures utilizing mild reducing agents. Further, a circuit structure and associated method of operation for the recovery and regeneration of the leakage current from the long-term storage capacitors is provided in order to enhance the manufacturing yield and utility performance of such devices.
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