发明授权
- 专利标题: HIGH PERMITTIVITY LOW LEAKAGE CAPACITOR AND ENERGY STORING DEVICE AND METHOD FOR FORMING THE SAME
- 专利标题(中): 高电阻低漏电容器和能量储存装置及其形成方法
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申请号: EP08835074.9申请日: 2008-10-03
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公开(公告)号: EP2206130B1公开(公告)日: 2018-05-09
- 发明人: Carver, David
- 申请人: Carver Scientific, Inc.
- 申请人地址: LBTC, Building 3000 8000 GSRI Ave. , Baton Rouge, LA 70820 US
- 专利权人: Carver Scientific, Inc.
- 当前专利权人: Carver Scientific, Inc.
- 当前专利权人地址: LBTC, Building 3000 8000 GSRI Ave. , Baton Rouge, LA 70820 US
- 代理机构: Manley, Nicholas Michael
- 优先权: US978067P 20071005
- 国际公布: WO2009046341 20090409
- 主分类号: H01G4/10
- IPC分类号: H01G4/10 ; H01G4/08 ; H01G4/38 ; H01G4/04 ; H02J7/00 ; H02J7/34
摘要:
A method is provided for making a high permittivity dielectric material for use in capacitors. Several high permittivity materials in an organic nonconductive media with enhanced properties and methods for making the same are disclosed. A general method for the formation of thin films of some particular dielectric material is disclosed, wherein the use of organic polymers, shellac, silicone oil, and/or zein formulations are utilized to produce low conductivity dielectric coatings. Additionally, a method whereby the formation of certain transition metal salts as salt or oxide matrices is demonstrated at low temperatures utilizing mild reducing agents. Further, a circuit structure and associated method of operation for the recovery and regeneration of the leakage current from the long-term storage capacitors is provided in order to enhance the manufacturing yield and utility performance of such devices.
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