发明公开
EP2248061A1 PROCEDE DE TEST DE CIRCUITS DE CRYPTOGRAPHIE, CIRCUIT DE CRYPTOGRAPHIE SECURISE APTE A ETRE TESTE, ET PROCEDE DE CABLAGE D'UN TEL CIRCUIT
审中-公开
检验方法KRYPTO GRAPHIC CIRCUITS受保护的测试资格密码电路和方法进行接线这样的电路
- 专利标题： PROCEDE DE TEST DE CIRCUITS DE CRYPTOGRAPHIE, CIRCUIT DE CRYPTOGRAPHIE SECURISE APTE A ETRE TESTE, ET PROCEDE DE CABLAGE D'UN TEL CIRCUIT
- 专利标题（英）： Method for testing cryptographic circuits, secured cryptographic circuit capable of being tested, and method for wiring such circuit
- 专利标题（中）： 检验方法KRYPTO GRAPHIC CIRCUITS受保护的测试资格密码电路和方法进行接线这样的电路
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申请号： EP09715962.8申请日： 2009-02-11
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公开(公告)号： EP2248061A1公开(公告)日： 2010-11-10
- 发明人: GUILLEY, Sylvain , DANGER, Jean-Luc
- 申请人： Institut Telecom - Telecom Paris Tech
- 申请人地址： 46, Rue Barrault 75013 Paris FR
- 专利权人： Institut Telecom - Telecom Paris Tech
- 当前专利权人： Institut Telecom - Telecom Paris Tech
- 当前专利权人地址： 46, Rue Barrault 75013 Paris FR
- 代理机构： Lucas, Laurent Jacques
- 优先权： FR0851184 20080225
- 国际公布： WO2009106428 20090903
- 主分类号： G06F21/00
- IPC分类号： G06F21/00 ; G01R31/317
摘要：
The invention relates to a method for testing cryptographic circuits. The invention also relates to a cryptographic circuit that can be tested, the cryptographic circuit including registers and logic gates (211, 212, 213, 214). According to the invention, a test comprises carrying out a differential consumption analysis (DPA) of the circuit registers. In a cryptographic circuit being secured and including a first half-circuit (211, 214) combined with a second half-circuit (212, 213) operating in a complementary logic, the power supply (Vdd1, 23, 25) of the first half-circuit is separated from the power supply (Vdd2, 24) of the second half-circuit, the differential consumption analysis being carried out in parallel on each half-circuit and both power supplies being grouped together into the same power supply after the test.
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