发明公开
EP2273356A3 Multi-touch detecting method for detecting locations of touched points on a touch panel 有权
用于检测点的多点触摸辨识方法触摸的触摸屏上的点

  • 专利标题: Multi-touch detecting method for detecting locations of touched points on a touch panel
  • 专利标题(中): 用于检测点的多点触摸辨识方法触摸的触摸屏上的点
  • 申请号: EP10168940.4
    申请日: 2010-07-08
  • 公开(公告)号: EP2273356A3
    公开(公告)日: 2012-11-07
  • 发明人: Chen, Po-YangShih, Po-Sheng
  • 申请人: Chimei InnoLux Corporation
  • 申请人地址: No. 160 Kesyue Road Chu-Nan Site Hsinchu Science Park Chu-Nan 350, Taipei TW
  • 专利权人: Chimei InnoLux Corporation
  • 当前专利权人: Chimei InnoLux Corporation
  • 当前专利权人地址: No. 160 Kesyue Road Chu-Nan Site Hsinchu Science Park Chu-Nan 350, Taipei TW
  • 代理机构: Gray, John James
  • 优先权: CN200910304242 20090710
  • 主分类号: G06F3/045
  • IPC分类号: G06F3/045 G06F3/041
Multi-touch detecting method for detecting locations of touched points on a touch panel
摘要:
A multi-touch detecting method is adapted for detecting touched points on a touch panel that includes first and second conductive films (113, 123). The first conductive film (113) exhibits electric anisotropy, and has a lower resistivity in a first direction. The multi-touch detecting method includes: applying a first voltage (V a ) to the first conductive film; applying a second voltage (V b ) greater than the first voltage to the second conductive film; measuring sequentially voltages at different measuring points (X u ) of the first conductive film; obtaining a first local maximum voltage, a second local maximum voltage and a local minimum voltage from the measured voltages; determining a first location (X a ) of the touched points based on a location of the measuring point (X n )corresponding to the first local maximum voltage; and determining a second location (X b ) of the touched points based on a location of the measuring point (X m ) corresponding to the second local maximum voltage.
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