发明公开
EP2277201A1 SIDEWALL STRUCTURED SWITCHABLE RESISTOR CELL 审中-公开
侧墙结构化切换电阻CELL

  • 专利标题: SIDEWALL STRUCTURED SWITCHABLE RESISTOR CELL
  • 专利标题(中): 侧墙结构化切换电阻CELL
  • 申请号: EP09731080.9
    申请日: 2009-04-01
  • 公开(公告)号: EP2277201A1
    公开(公告)日: 2011-01-26
  • 发明人: SCHEUERLEIN, Roy, E.
  • 申请人: Sandisk 3D LLC
  • 申请人地址: 601 McCarthy Boulevard Milpitas, CA 95035-7932 US
  • 专利权人: Sandisk 3D LLC
  • 当前专利权人: Sandisk 3D LLC
  • 当前专利权人地址: 601 McCarthy Boulevard Milpitas, CA 95035-7932 US
  • 代理机构: Tothill, John Paul
  • 优先权: US216110 20080630; US71093 20080411
  • 国际公布: WO2009126492 20091015
  • 主分类号: H01L27/24
  • IPC分类号: H01L27/24 H01L45/00
SIDEWALL STRUCTURED SWITCHABLE RESISTOR CELL
摘要:
A method of making a memory device includes forming a first conductive electrode (28), forming an insulating structure (13) over the first conductive electrode, forming a resistivity switching element (14) on a sidewall of the insulating structure, forming a second conductive electrode (26) over the resistivity switching element, and forming a steering element (22) in series with the resistivity switching element between the first conductive electrode and the second conductive electrode, wherein a height of the resistivity switching element in a first direction from the first conductive electrode to the second conductive electrode is greater than a thickness of the resistivity switching element in second direction perpendicular to the first direction.
信息查询
0/0