发明授权
- 专利标题： STUN DEVICE TESTING APPARATUS AND METHODS
- 专利标题（中）： 测试人员和方法防触电装置
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申请号： EP09736720.5申请日： 2009-09-23
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公开(公告)号： EP2342950B1公开(公告)日： 2014-08-27
- 发明人: BURNS, Stephen , MARINO, Bruno, D.V. , STETHEM, Kenneth, J.
- 申请人： Aegis Industries, Inc.
- 申请人地址： 2275 Research Blvd Suite 500 Rockville, MD 20850 US
- 专利权人： Aegis Industries, Inc.
- 当前专利权人： Aegis Industries, Inc.
- 当前专利权人地址： 2275 Research Blvd Suite 500 Rockville, MD 20850 US
- 代理机构： Lawrence, John
- 优先权： US99529P 20080923
- 国际公布： WO2010036680 20100401
- 主分类号： H05C3/00
- IPC分类号： H05C3/00 ; F41H13/00
摘要：
A method of testing an electric discharge stun device includes the steps of identifying a stun device to be tested and absorbing a discharge from the stun device into a tester. The discharge is characterized by a discharge characteristic that is then compared automatically to information such as (a) a previous corresponding characteristic associated with a previous discharge of the stun device or (b) a corresponding characteristic associated with a prior discharge of at least one other stun device. The characteristic can be a waveform, a peak voltage, duration, current, joule, and temperature.
公开/授权文献
- EP2342950A1 STUN DEVICE TESTING APPARATUS AND METHODS 公开/授权日：2011-07-13
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