发明公开
- 专利标题: NON-LINEAR HISTOGRAM SEGMENTATION FOR PARTICLE ANALYSIS
- 专利标题(中): 非线性直方图分割粒子分析
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申请号: EP09747993.5申请日: 2009-11-02
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公开(公告)号: EP2352985A1公开(公告)日: 2011-08-10
- 发明人: RAMIREZ, Carlos, A. , PARK, Jaesang , LU, Jiuliu
- 申请人: Beckman Coulter, Inc.
- 申请人地址: 250 S. Kraemer Boulevard Brea, 92821 CA US
- 专利权人: Beckman Coulter, Inc.
- 当前专利权人: Beckman Coulter, Inc.
- 当前专利权人地址: 250 S. Kraemer Boulevard Brea, 92821 CA US
- 代理机构: Penny, Daryl
- 优先权: US111091P 20081104; US608756 20091029
- 国际公布: WO2010053874 20100514
- 主分类号: G01N15/14
- IPC分类号: G01N15/14 ; G01N15/10
摘要:
Systems and methods for non-linear histogram segmentation for particle analysis are provided. In one embodiment, a method for analyzing particles comprises creating an initial two-dimensional histogram based on two selected parameters of the particles, filtering the initial two-dimensional histogram to generate a filtered two-dimensional image, detecting a plurality of seed populations in the filtered two-dimensional image, generating one or more linear contour lines, each having a plurality of contour points, to separate the detected seed populations, and adjusting the contour points in at least one of the linear contour lines to separate the detected seed populations.
公开/授权文献
- EP2352985B1 NON-LINEAR HISTOGRAM SEGMENTATION FOR PARTICLE ANALYSIS 公开/授权日:2022-03-16
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