发明公开
- 专利标题： ADC Testing
- 专利标题（中）： ADC-测试
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申请号： EP11250312.3申请日： 2011-03-16
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公开(公告)号： EP2372916A2公开(公告)日： 2011-10-05
- 发明人: Hamilton, David , Ateeda Ltd. , Sharp, Gordon , Ateeda Ltd.
- 申请人： Ateeda Ltd.
- 申请人地址： CBC House 24 Canning Street Edinburgh EH3 8EG GB
- 专利权人： Ateeda Ltd.
- 当前专利权人： Ateeda Ltd.
- 当前专利权人地址： CBC House 24 Canning Street Edinburgh EH3 8EG GB
- 代理机构： Kinsler, Maureen Catherine
- 优先权： US314350P 20100316
- 主分类号： H03M1/12
- IPC分类号： H03M1/12
摘要：
A histogram-based method for testing an electronic converter device, such as an analogue to digital converter, the method comprising: defining at least one histogram hyperbin arranged to store hits for at least one subrange of output codes; applying an input test stimulus to an input of the device to test a subrange of output codes matched to the hyperbin; and accumulating the histogram.
公开/授权文献
- EP2372916A3 ADC Testing 公开/授权日：2013-04-17
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