发明授权
EP2375391B1 METHOD FOR COLLECTING DEVICE STATE INFORMATION AND DEVICE STATE INFORMATION COLLECTION KIT USED FOR THE METHOD 有权
用于收集设备状态信息的方法和用于该方法的设备状态信息收集工具

  • 专利标题: METHOD FOR COLLECTING DEVICE STATE INFORMATION AND DEVICE STATE INFORMATION COLLECTION KIT USED FOR THE METHOD
  • 专利标题(中): 用于收集设备状态信息的方法和用于该方法的设备状态信息收集工具
  • 申请号: EP09833344.6
    申请日: 2009-12-07
  • 公开(公告)号: EP2375391B1
    公开(公告)日: 2018-04-11
  • 发明人: NAGASE Mamoru
  • 申请人: TLV Co., Ltd.
  • 申请人地址: 881 Nagasuna Noguchi-cho Kakogawa-shi Hyogo 675-8511 JP
  • 专利权人: TLV Co., Ltd.
  • 当前专利权人: TLV Co., Ltd.
  • 当前专利权人地址: 881 Nagasuna Noguchi-cho Kakogawa-shi Hyogo 675-8511 JP
  • 代理机构: Lemcke, Brommer & Partner Patentanwälte Partnerschaft mbB
  • 优先权: JP2008321215 20081217
  • 国际公布: WO2010071040 20100624
  • 主分类号: H04Q9/00
  • IPC分类号: H04Q9/00 G05B19/418
METHOD FOR COLLECTING DEVICE STATE INFORMATION AND DEVICE STATE INFORMATION COLLECTION KIT USED FOR THE METHOD
摘要:
Accurate device-condition information of and relating to a number of devices to be managed are collected in an efficient manner. The number of devices 2 to be managed are divided between a direct collection group comprised of some managed devices 2 whose device-condition information are collected by detecting operation by a portable (mobile) unit 4 for device condition detection on each one of these managed devices 2 and an indirect collection group 8a, 8b comprised of the other managed devices 2 whose device-condition information are collected by communication between each one of these managed devices 2 and a stationary unit 5, 6 disposed to be capable of detecting the device-condition information of the device 2.
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