Invention Publication
EP2395347A1 Device and method for performing electrical impedance tomography
有权
Vorrichtung und Verfahren zurdurchführungelektrischer Impedanztomographie
- Patent Title: Device and method for performing electrical impedance tomography
- Patent Title (中): Vorrichtung und Verfahren zurdurchführungelektrischer Impedanztomographie
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Application No.: EP11168982.4Application Date: 2011-06-07
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Publication No.: EP2395347A1Publication Date: 2011-12-14
- Inventor: Langoju, Rajesh Verra Venkata Lakshmi , Meethal, Manoj Kumar Koyithitta , Mishra, Debasish , Mahalingam, Sakethraman
- Applicant: General Electric Company
- Applicant Address: 1 River Road Schenectady, NY 12345 US
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: 1 River Road Schenectady, NY 12345 US
- Agency: Illingworth-Law, William Illingworth
- Priority: US797653 20100610
- Main IPC: G01N27/02
- IPC: G01N27/02 ; G01N33/28 ; A61B5/053 ; G01R27/02
Abstract:
A method of providing an image of an interior of a structure (46) containing regions having different conductivities or admittivities. In one embodiment a series of electrical signal sets (V i ) is applied to a series of electrodes, each signal set generating a rotating electric field. A measured set of electrical signals obtained from the electrodes (44) is used to calculate a conductivity or admittivity distribution representative of the interior of the structure in a region about which the electrodes (44) are positioned. The process of calculating the distribution includes defining a cost function, e.g., the energy function based on the distribution, and a forward model expressing the measured set of electrical signals as a function of the change in voltage values with respect to conductivity or admittivity and requiring that the partial derivative of the difference between the energy function and a function based on the forward model equal zero.
Public/Granted literature
- EP2395347B1 Device and method for performing electrical impedance tomography Public/Granted day:2013-04-03
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