发明公开
EP2395347A1 Device and method for performing electrical impedance tomography
有权
Vorrichtung und Verfahren zurdurchführungelektrischer Impedanztomographie
- 专利标题: Device and method for performing electrical impedance tomography
- 专利标题(中): Vorrichtung und Verfahren zurdurchführungelektrischer Impedanztomographie
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申请号: EP11168982.4申请日: 2011-06-07
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公开(公告)号: EP2395347A1公开(公告)日: 2011-12-14
- 发明人: Langoju, Rajesh Verra Venkata Lakshmi , Meethal, Manoj Kumar Koyithitta , Mishra, Debasish , Mahalingam, Sakethraman
- 申请人: General Electric Company
- 申请人地址: 1 River Road Schenectady, NY 12345 US
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: 1 River Road Schenectady, NY 12345 US
- 代理机构: Illingworth-Law, William Illingworth
- 优先权: US797653 20100610
- 主分类号: G01N27/02
- IPC分类号: G01N27/02 ; G01N33/28 ; A61B5/053 ; G01R27/02
摘要:
A method of providing an image of an interior of a structure (46) containing regions having different conductivities or admittivities. In one embodiment a series of electrical signal sets (V i ) is applied to a series of electrodes, each signal set generating a rotating electric field. A measured set of electrical signals obtained from the electrodes (44) is used to calculate a conductivity or admittivity distribution representative of the interior of the structure in a region about which the electrodes (44) are positioned. The process of calculating the distribution includes defining a cost function, e.g., the energy function based on the distribution, and a forward model expressing the measured set of electrical signals as a function of the change in voltage values with respect to conductivity or admittivity and requiring that the partial derivative of the difference between the energy function and a function based on the forward model equal zero.
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