- 专利标题： Multi-domain test and measurement instrument
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申请号： EP11182916.4申请日： 2011-09-27
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公开(公告)号： EP2434299B1公开(公告)日： 2018-07-25
- 发明人: Dobyns, Kenneth
- 申请人： Tektronix, Inc.
- 申请人地址： 14150 SW Karl Braun Drive P.O. Box 500, M/S 50-LAW Beaverton, Oregon 97077-0001 US
- 专利权人： Tektronix, Inc.
- 当前专利权人： Tektronix, Inc.
- 当前专利权人地址： 14150 SW Karl Braun Drive P.O. Box 500, M/S 50-LAW Beaverton, Oregon 97077-0001 US
- 代理机构： HGF Limited
- 优先权： US892774 20100928
- 主分类号： G01R13/02
- IPC分类号： G01R13/02 ; G01R23/16
摘要：
A test and measurement instrument (170) including an input port (172) configured to receive an input signal; a digitizer (176) configured to digitize the input signal; a decimator (178) coupled to the digitizer and configured to decimate the digitized input signal to generate a decimated input signal (188); a digital downconverter (180) coupled to the digitizer and configured to frequency shift the digitized input signal to generate a frequency shifted input signal (186); and a memory (182) configured to store the decimated input signal and the frequency shifted input signal.
公开/授权文献
- EP2434299A1 Multi-domain test and measurement instrument 公开/授权日：2012-03-28
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