发明公开
EP2568268A1 Method for estimating the temperature of a semiconductor chip
审中-公开
Verfahren zur Bestimmung der Temperatur eines Halbleiterchips
- 专利标题： Method for estimating the temperature of a semiconductor chip
- 专利标题（中）： Verfahren zur Bestimmung der Temperatur eines Halbleiterchips
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申请号： EP11180313.6申请日： 2011-09-07
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公开(公告)号： EP2568268A1公开(公告)日： 2013-03-13
- 发明人: Thøgersen, Paul Bach , Rannestad, Bjørn
- 申请人： kk-electronic a/s
- 申请人地址： Bøgildvej 3 7430 Ikast DK
- 专利权人： kk-electronic a/s
- 当前专利权人： kk-electronic a/s
- 当前专利权人地址： Bøgildvej 3 7430 Ikast DK
- 代理机构： Høiberg A/S
- 主分类号： G01K7/01
- IPC分类号： G01K7/01 ; G01K15/00 ; F03D11/00 ; H01L23/473
摘要：
The invention regards a method for estimating the temperature of a semiconductor chip accommodated in a power semiconductor device in operation, such as an IGBT power module, the method comprising the steps of; while the power semiconductor device is in operation determining a voltage drop over the power semiconductor device for at least a first value of applied current and; estimating the temperature of the semiconductor chip by evaluating the relationship between the determined voltage drop and the first value of applied current on the basis of a semiconductor chip temperature model.
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