发明公开
EP2584346A1 DEFECT OCCURRENCE SOURCE IDENTIFICATION METHOD AND CONVEYING DEVICE MAINTENANCE METHOD
审中-公开
一种用于识别来源问题缺陷及维护方法用于输送机
- 专利标题: DEFECT OCCURRENCE SOURCE IDENTIFICATION METHOD AND CONVEYING DEVICE MAINTENANCE METHOD
- 专利标题(中): 一种用于识别来源问题缺陷及维护方法用于输送机
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申请号: EP11795715.9申请日: 2011-06-13
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公开(公告)号: EP2584346A1公开(公告)日: 2013-04-24
- 发明人: SHIOYA Toshikazu , MURATA Mitsuru , TAKATANI Kenichi , TAKIGUCHI Tetsushi , INOUE Shunji
- 申请人: Asahi Glass Company, Limited
- 申请人地址: 5-1, Marunouchi 1-chome Chiyoda-ku Tokyo 100-8405 JP
- 专利权人: Asahi Glass Company, Limited
- 当前专利权人: Asahi Glass Company, Limited
- 当前专利权人地址: 5-1, Marunouchi 1-chome Chiyoda-ku Tokyo 100-8405 JP
- 代理机构: Müller-Boré & Partner Patentanwälte
- 优先权: JP2010138641 20100617
- 国际公布: WO2011158810 20111222
- 主分类号: G01N21/88
- IPC分类号: G01N21/88 ; C03B35/16 ; G01N21/892
摘要:
The present invention relates to a method for identifying a defect occurrence source, said method including identifying a roll that generates defects at constant intervals in a conveying direction of a sheet-shaped glass when the sheet-shaped glass is conveyed by a plurality of rolls in an annealing device including a conveying device having the plurality of rolls, in which a peripheral velocity of a certain roll of the plurality of rolls is changed so as to be different from a conveyance speed of the sheet-shaped glass, thereby identifying a roll constituting the defect occurrence source, according to the result of a determination on whether or not there has been a change in intervals between the defects before and after changing the peripheral velocity.
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