发明公开
- 专利标题: Exhaust gas sampling device
- 专利标题(中): 废气采样装置
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申请号: EP13000741.2申请日: 2013-02-13
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公开(公告)号: EP2629077A3公开(公告)日: 2017-12-27
- 发明人: Rahman, Montajir , Nakane, Masahiro , Hara, Kenji , Nakatani, Shigeru
- 申请人: HORIBA, LTD.
- 申请人地址: 2, Miyanohigashi-cho, Kisshoin, Minami-ku Kyoto-shi, Kyoto 601-8510 JP
- 专利权人: HORIBA, LTD.
- 当前专利权人: HORIBA, LTD.
- 当前专利权人地址: 2, Miyanohigashi-cho, Kisshoin, Minami-ku Kyoto-shi, Kyoto 601-8510 JP
- 代理机构: Müller Hoffmann & Partner
- 优先权: JP2012029921 20120214
- 主分类号: G01N1/22
- IPC分类号: G01N1/22 ; F01N3/20
摘要:
The present invention is directed to an exhaust gas sampling device intended to heat or cool a temperature of sampled exhaust gas flowing through a sampling line to a desired temperature in accordance with such as various exhaust gas conditions and usage conditions of the sampling line irrespective of a temperature of the exhaust gas flowing through an exhaust pipe, and includes the sampling line 2 for sampling the exhaust gas to be introduced into an analyzing instrument 3; a plurality of heating parts 41 to 43 provided along the sampling line 2 from an upstream side to a downstream side for heating the exhaust gas flowing through the sampling line 2; and a temperature control part 5 for individually setting set temperatures of the plurality of heating parts 41 to 43 using the temperature of the exhaust gas in the exhaust pipe H and a target temperature T A of the exhaust gas in an outlet side of the heating part 43 located in the most downstream as parameters.
公开/授权文献
- EP2629077A2 Exhaust gas sampling device 公开/授权日:2013-08-21
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