Invention Grant
- Patent Title: ATMOSPHERIC MEASUREMENT SYSTEM AND METHOD
- Patent Title (中): 大气测量系统和方法
-
Application No.: EP11857829.3Application Date: 2011-02-02
-
Publication No.: EP2671103B1Publication Date: 2017-11-01
- Inventor: TCHORYK, Peter, Jr. , ZUK, David Michael , JOHNSON, David Keith , RICHEY, Charles J. , TAYEBATI, Parviz
- Applicant: Michigan Aerospace Corporation
- Applicant Address: 1777 Highland Drive Suite B Ann Arbor, Michigan 48108-2285 US
- Assignee: Michigan Aerospace Corporation
- Current Assignee: Michigan Aerospace Corporation
- Current Assignee Address: 1777 Highland Drive Suite B Ann Arbor, Michigan 48108-2285 US
- Agency: Puschmann Borchert Bardehle Patentanwälte Partnerschaft mbB
- International Announcement: WO2012105973 20120809
- Main IPC: G01W1/00
- IPC: G01W1/00 ; G01N21/47 ; G01W1/10
Abstract:
One of first and second beams (28) of corresponding first and second light (13) are projected into an atmosphere (20) and at least one physical property of the atmosphere (20) is detected from the interference pattern (47) generated from the resulting scattered light (30). The first and second beams (20) are selected responsive to either a detected signal-to-noise ratio (SNR) or a detected aerosol-to-molecular ratio (AMR). The wavelength (740) of the first light (13) provides for either molecular or aerosol scattering, whereas the wavelength (738) of the second light (13) provides for primarily only aerosol scattering. In accordance with a second aspect, scattered light (30) from one or more beams (28) of substantially monochromatic light (13) projected into the atmosphere (20) and received from a plurality of interaction regions (17) or measurement volumes (52) provides for determining wind power (P*) within a region of the atmosphere (20).
Public/Granted literature
- EP2671103A1 ATMOSPHERIC MEASUREMENT SYSTEM AND METHOD Public/Granted day:2013-12-11
Information query