- 专利标题: MASS ANALYSER AND METHOD OF MASS ANALYSIS
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申请号: EP11764713.1申请日: 2011-09-28
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公开(公告)号: EP2681759B1公开(公告)日: 2018-11-21
- 发明人: DING, Li , SUDAKOV, Mikhail , KUMASHIRO, Sumio
- 申请人: Shimadzu Corporation
- 申请人地址: 1 Nishinokyo-Kuwabaracho Nakagyo-ku Kyoto 604-8511 JP
- 专利权人: Shimadzu Corporation
- 当前专利权人: Shimadzu Corporation
- 当前专利权人地址: 1 Nishinokyo-Kuwabaracho Nakagyo-ku Kyoto 604-8511 JP
- 代理机构: Smallman, Clint Guy
- 优先权: GB201103361 20110228
- 国际公布: WO2012116765 20120907
- 主分类号: H01J49/42
- IPC分类号: H01J49/42 ; H01J49/02 ; H01J49/40
摘要:
An electrostatic ion trap for mass analysis includes a first array of electrodes and a second array of electrodes, spaced from the first array of electrode. The first and second arrays of electrodes may be planar arrays formed by parallel strip electrodes or by concentric, circular or part-circular electrically conductive rings. The electrodes of the arrays are supplied with substantially the same pattern of voltage whereby the distribution of electrical potential in the space between the arrays is such as to reflect ions isochronously in a flight direction causing them to undergo periodic, oscillatory motion in the space, focused substantially mid-way between the arrays. Amplifier circuitry is used to detect image current having frequency components related to the mass-to-charge ratio of ions undergoing the periodic, oscillatory motion.
公开/授权文献
- EP2681759A1 MASS ANALYSER AND METHOD OF MASS ANALYSIS 公开/授权日:2014-01-08
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