发明公开
- 专利标题: Slit lamp microscope
- 专利标题(中): 裂隙灯显微镜
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申请号: EP13179237.6申请日: 2013-08-05
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公开(公告)号: EP2695572A1公开(公告)日: 2014-02-12
- 发明人: Watanabe, Takahiro , Takeda, Takanori
- 申请人: Kabushiki Kaisha Topcon
- 申请人地址: 75-1 Hasunuma-cho Itabashi-ku Tokyo 174-8580 JP
- 专利权人: Kabushiki Kaisha Topcon
- 当前专利权人: Kabushiki Kaisha Topcon
- 当前专利权人地址: 75-1 Hasunuma-cho Itabashi-ku Tokyo 174-8580 JP
- 代理机构: Vossius & Partner
- 优先权: JP2012175277 20120807
- 主分类号: A61B3/135
- IPC分类号: A61B3/135
摘要:
A slit lamp microscope of an embodiment comprises a light source, a pair of slit blades, an actuator, a mechanism, a storage, an operating part and a controller. The light source emits illumination light. The slit blades generate slit light from the illumination light. The actuator generates a driving force. The mechanism changes the interval between the slit blades based on the driving force. The storage stores one or more pieces of interval information each indicating an interval between the slit blades. When a user specifies one from among the one or more pieces of interval information using the operating part, the controller control the actuator such that the interval between the slit blades becomes the interval indicated in the specified interval information.
公开/授权文献
- EP2695572B1 Slit lamp microscope 公开/授权日:2016-01-20
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